Graf Cis wafers: File: cis-3695-12-cv-pgcd.html Measurement: Prague ) Type of structure: Pgcd (Diode with guardring on testfield p-side design, nn- No nitride, ni- Nitride )


Comment: The probable reason of the nn3.txt and ni4.txt shape - insufficient contact force of the test needle.

Valid .txt files:.....cis-3695-12-cv-nn3.txt.....cis-3695-12-cv-nn4.txt.....cis-3695-12-cv-ni4.txt
Aktualizováno: 4.3.2000
Autor: tomasekm
Elektronická adresa: tomasekm@fzu.cz