3696-20 Wafer Cross-Calibration Measurements


  Tile, no dot grid   Tile, large dot grid   Tile, small dot grid
  S-chip_1, t-like, no dot grid   S-chip_1, t-like, large dot grid   S-chip_1, t-like, small dot grid
    IV on Diode with Guard Ring  


  CV on Diode with Guard Ring   Depletion Voltage   Depletion Voltage
  CV on MOS with NO NITRIDE   CV on MOS with NITRIDE  
   
   


Back to the Pixel home page
 


Lukas Tomasek , 29.XI.99